FIME explores embedded SIM testing and integration responsibilities of IoT stakeholders

FIME_WhitepaperTo promote the development of a robust and interoperable internet of things (IoT) ecosystem, FIME has launched a new eBook entitled Building a trusted embedded SIM testing framework in the age of IoT. The document highlights the testing and integration responsibilities of the different stakeholder groups engaged in the lifecycle management of the newly standardized embedded SIM.

“The advent of IoT is triggering a profound shift in the way the SIM card ecosystem operates,” said Guillaume Lemoine, Head of Product and Services Marketing – Telecom at FIME. “For the first time, OEMs are sourcing the SIM component direct from manufacturers, independent of the mobile network operators. This places new responsibility on the shoulders of OEMs which, until now, have had little exposure to SIM setup, interoperability and integration testing, and lifecycle management practices.”

FIME’s eBook explores how the SIM lifecycle management ecosystem has changed following the introduction of the embedded SIM. It also provides an overview of key testing priorities by stakeholder group, including MNOs, IoT device and solution providers, IoT modem manufacturers and embedded SIM manufacturers.

“One of the biggest challenges the ecosystem now faces is for stakeholders to establish a secure and trusted connectivity chain, so their various technologies can interoperate appropriately,” adds Lemoine. “This requires technical standards and a robust framework for interoperability and integration testing that will enable stakeholders to share sensitive subscriber information securely. FIME is deeply engaged in this effort and each stakeholder must recognize the role they have to play. Once they are ‘in the field’ embedded SIMs cannot be removed or replaced, so for the first wave of IoT solutions, the ecosystem only has one chance to get this right.”

Building a trusted embedded SIM testing framework in the age of IoT is available for download without charge from the FIME website.

 

Tags: ,

Categories: IoT, Testing

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